Abstract
Lead zirconate titanate, PbZr 1-x Ti x O 3 (PZT) nanotubes of different wall thicknesses ranging from 3 to 80 nm deposited on (001) -oriented SrTiO 3 substrates have been studied by variable-temperature ultraviolet Raman spectroscopy. Spectra were measured in the temperature range of 10 – 800 K with ultraviolet excitation by a 325 nm He-Cd laser. The spectra of the PZT thin film were measured for comparison. Analysis of temperature dependence of Raman intensities allowed us to determine ferroelectric phase transition temperature as a function of wall thickness, which was found to vary from ~100 to 650 K. At wall thicknesses above 20 nm the he phase transition temperature of the nanotubes aproaches its bulk value.
| Original language | American English |
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| State | Published - 1 Jul 2016 |
| Event | Idaho Conference on Undergraduate Research 2016 - Boise State University, Boise, United States Duration: 1 Jul 2016 → … |
Conference
| Conference | Idaho Conference on Undergraduate Research 2016 |
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| Abbreviated title | ICUR 2016 |
| Country/Territory | United States |
| City | Boise |
| Period | 1/07/16 → … |
EGS Disciplines
- Condensed Matter Physics