Ultraviolet Raman Spectroscopy of Nanoscale Ferroelectric Thin Films and Superlattices

Research output: Chapter in Book/Report/Conference proceedingChapter

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Abstract

Untraviolet Raman spectroscopy has emerged as a powerful technique for characterization of nanoscale materials, in particular, wide-bandgap semiconductors and dielectrics. The advantages of ultraviolet excitation for Raman measurements of ferroelectric thin films and heterostructures, such as reduced penetration depth and enhanced scattering intensity, are discussed. Recent results of application of ultraviolet Raman spectroscopy for studies of the lattice dynamics and phase transitions in nanoscale ferrelectric structures, such as superlattices based on BaTiO 3 , SrTiO 3 , and CaTiO 3 , as well as ultrathin films of BaTiO 3 and SrTiO 3 are reviewed.

Original languageAmerican English
Title of host publicationRaman Spectroscopy for Nanomaterials Characterization
Pages587-624
Number of pages38
Volume9783642206207
ISBN (Electronic)9783642206207
DOIs
StatePublished - 1 Jan 2012

Publication series

NamePhysics Faculty Publications and Presentations

EGS Disciplines

  • Physics

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