X-Ray Radiation Induced Effects in Selected Chalcogenide Glasses and CBRAM Devices Based on Them

Maria Mitkova, Kasandra Wolf, George Belev, Mahesh Ailavajhala, Dmitri A. Tenne, Hugh Barnaby, Michael N. Kozicki

Research output: Contribution to journalArticlepeer-review

5 Scopus citations
Original languageAmerican English
JournalElectrical and Computer Engineering Faculty Publications and Presentations
DOIs
StatePublished - 1 Jun 2016

Keywords

  • CBRAM devices
  • conductive bridge resistance change memory
  • structure
  • thin films
  • x-ray radiation

EGS Disciplines

  • Electrical and Computer Engineering

Fingerprint

Dive into the research topics of 'X-Ray Radiation Induced Effects in Selected Chalcogenide Glasses and CBRAM Devices Based on Them'. Together they form a unique fingerprint.

Cite this